WBE WeibangRapid temperature change testing machineSatisfy linear and nonlinear temperature rise and fall methods, and can perform temperature stress (ESS) detection, temperature and humidity screening, reliability testing, etc. on test specimens.
application area:
Semiconductor chips, research institutions, quality inspection, new energy, optoelectronic communication, aerospace and military industry, automotive industry, LCD display, medical and other technology industries.
We provide you with 24-hour industry testing solutions and non-standard customization requirements.
For more product details, please consult 139-2290-2928
1. Optional heating and cooling rates:5~30℃/min;
2. The product adopts an integrated box design, which is more reasonable and compact in structure;
3. Adopting electronic expansion valve technology and innovative control system, the product is efficient and energy-saving>30%;
4. Full lifecycle system monitoring, multiple protections, and convenient maintenance.
1. Customizable as needed (X: linear, F: Nonlinear heating and cooling method. 2. Humidity is optional.
1、 Main technical parameters |
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name |
Rapid temperature change testing machine |
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model |
WBE-KSH-150LA/C-X/F10 |
WBE-KSH-225LA/C-X/F10 |
WBE-KSH-512LA/C-X/F10 |
WBE-KSH-1000LA/C-X/F10 |
WBE-KSH-2400LA/C-X/F10 |
WBE-KSH-3400LA/C-X/F10 |
WBE-KSH-4600LA/C-X/F10 |
internal volume(L) |
150 L |
225 L |
512 L |
1000 L |
2400 L |
3400 L |
4600 L |
inside dimensions(WxDxH) (mm) Width Depth Height |
500x500x600 |
600x500x750 |
800x800x800 |
1100x900x1100 |
1300x1400x1300 |
1500x1500x1500 |
1800x1500x1700 |
window(WxH) Width and Height (mm) |
210x300 |
280x350 |
360x510 |
360x510 |
360x510 |
360x510*2 |
360x510*2 |
Linear temperature range ℃ and linear temperature ratemin/℃ |
-40-125 ℃ (AX linear 2 ℃/5 ℃/10 ℃/15 ℃/20 ℃/25 ℃); AF Nonlinear 2 ℃/5 ℃/10 ℃/15 ℃/20 ℃/25 ℃) |
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AX2、AX5、AX10、AX15、AX20、AX25 , AF2、AF5、AF10、AF15、AF20、AF25; For example, AX15: Linear 15 ℃, linear range -40~125 ℃;; AF15: Nonlinear (average) 15 ℃, nonlinear range:- 40-125 ℃. |
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Nonlinear (average) temperature range ℃ and nonlinear (average) temperature ratemin/℃ |
-55-125 ℃ (CX linear 2 ℃/5 ℃/10 ℃/15 ℃); CF Nonlinear 2 ℃/5 ℃/10 ℃/15 ℃/20 ℃/25 ℃) |
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CX2、CX5、CX10、CX15,CF2、CF5、CF10、CF15、CF20、CF25; For example, CX10: linear 10 ℃, linear range -55~125 ℃; CF10: Nonlinear 10 ℃ (average), nonlinear range:- 55-125 ℃. |
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Environmental requirements |
The temperature requirement for air-cooled environment is+5~+30 ℃/the temperature requirement for water-cooled environment is+5~+40 ℃ (water-cooled environment requires installation of water tower or ice water machine). |
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Temperature performance indicators: |
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temperature range |
-70℃~+150℃ |
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temperature uniformity |
≤ 2.0 ℃. |
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Temperature deviation |
≤± 2.0 ℃. |
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Temperature fluctuation |
≤± 0.5 ℃ (≤± 0.5 ℃, expressed according to GB/T5170-1996). |
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power supply |
AC380V ± 10%, 50Hz ± 1 three-phase four wire+grounding wire (3/N/PE), grounding resistance less than 4 Ω. |
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Humidity performance indicators: |
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temperature range |
+10 ℃ to+95 ℃. |
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Humidity range |
10% RH~98% RH (5%~98% R.H; customized for special conditions). |
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humidity uniformity |
≤ 3.0% RH. |
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Humidity deviation |
+2.0% RH to -3.0% RH (± 3.0% RH according to GB/T 2423.3-2008). |
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Humidity fluctuation |
≤± 2.0% RH. |
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All testing points for temperature and humidity |
Control reference 2.2 "Temperature and Humidity Control Capability Curve Chart". |
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Temperature and humidity time resolution |
Temperature: 0.01 ℃; Humidity: 0.1%; Time: 0.01min. |
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Standard configuration |
One observation window (double-layer hollow tempered conductive glass), one testing hole with a diameter of 50/100mm (located on the left), two sample racks, one camera light (LED light) inside the box, one water supply box, one weather strip for wet bulb, four small wheels, and one power cord. |
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Temperature and Humidity Range Control Chart |
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Model Description |
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1、 Meet the testing standards:
GB/T 2423.1 Low temperature test methods
GJB 150.3 High Temperature Test
GB/T 2423.2 High temperature test methods
GJB 150.4 Low Temperature Test
GB/T2423.34 Wet heat cycle test method
GJB 150.9 Damp Heat Test
IEC60068-2 Temperature and Humidity Test Method
MIL-STD-202G-103B Humidity Test
2、 Compatible testing standards:
IEC-60749-25: Semiconductor Devices - Temperature Cycling
IEC-60068-2-14 Nb: Environmental testing - temperature changes
IEC-61747-5: Liquid Crystal and Solid State Display Devices - Environmental, Durability, and Mechanical Testing Methods
JESD22-A105-C: Solid state devices, testing quality and reliability - power and temperature cycling
SAE-J1211: Recommended Environmental Practices for Automotive Component Electronic Device Design
IPC-9701: Performance testing methods and qualification requirements for surface mount welding attachments